The objectives of this stay are: to learn about surface characterization at the nanoscale and to participate in the development of an atomic force microscope device for outreach purposes.
The main role of the intern will be to acquire basic knowledge of an outstanding technique as the Atomic Force Microscopy (AFM). The AFM is a characterization technique used in a broad range of areas from quality control in semiconductor industry to fundamental studies in nanomedicine. Moreover, the learning process will be addressed through the development of a simil of a AFM force probe system. The objective is to build a didactic prototype of macrocantilever oscillator with an optical system that could be used for teaching purposes.
Once the student understand the principles of the technique , we will carry out some experiments of surface characterization by AFM.